Gettering and Defect Engineering in Semiconductor Technology XIII
GADEST 2009 : Proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, North of Berlin, Germany, September 26-October 02, 2009eBook - 2010
This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, submitted by internationally recognized experts in the field, review the state-of-the-art and likely future trends in their respective research field. Upon comparing this volume with previous volumes, it is clearly seen that defect engineering in photovoltaics is becoming a topic of ever-increasing inte.
Publisher: Stafa-Zuerich, Switzerland : Trans Tech Publications, ©2010
Characteristics: 1 online resource (xiv, 592 pages) : illustrations
Alternative Title: GADEST 2009